Microscopy Calibration, Test & Reference Standards Overview

Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data.  This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.
 

SEM - FIB - FESEM - Table top SEM
MCS-1 & MCS-0.1 traceable or certified high magnification calibration standards	MTC-5 multiple targets for medium & low magnification calibration, traceable	LAMC-15 traceable low magnification / large area calibration standard
M-1 & M-10 traceable grid patterns with 1 and 10µm pitch	Gold on carbon resolution test specimens	Tin on carbon resolution test specimens
SEM / EDS / WDS
EDS / WDS compact calibration standards	EDS / WDS reference standard for quantitative analysis	Faraday cup for beam current measurements
TEM - TEM / EDS
TEM resolution standards	TEM test standards	TEM EDS calibration standard
MAG*I*CAL traceable TEM calibration standard
AFM-SPM
AFM TipCheck sample	AFM XYZ Standards	HOPG Standards
LM - Digital Imaging
Glass stage micrometers and graticules; Linear, cross and compound, optional certificates	Micro-Tec Silicon based graticules; linear, cross and compound, traceable	Micro-Tec MTC-5 multiple targets traceable calibration standard