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Material for EM-Tec SEM stub gripper tweezers

Order EM-Tec SEM stub gripper tweezers

The material used for manufacturing the EM-Tec SEM stub gripper tweezers is a selected grade of non-magnetic AISI 304.

It is used for the following products:
#50-050012 EM-Tec 127G.AM SEM stub gripper tweezers for Ø12.7mm (1/2”) grooved pin stubs
#50-050019 EM-Tec 190G.AM SEM stub gripper tweezers for Ø19.0mm (1”) grooved pin stubs
#50-050025 EM-Tec 254G.AM SEM stub gripper tweezers for Ø25.5mm (3/4”) grooved pin stubs
#50-050032 EM-Tec 318G.AM SEM stub gripper tweezers for Ø32.0mm (1-1/4”) grooved pin stubs
#50-050013 EM-Tec 12.AM scissor type SEM stub gripper tweezers for Ø12.7mm (1/2”) grooved pin stubs
#50-050026 EM-Tec 25.AM SEM scissor type stub gripper tweezers for Ø25.5mm (3/4”) grooved pin stubs
#50-050110 EM-Tec 95.AM SEM stub gripper tweezers for Ø9.5mm JEOL cylinder stubs
#50-050112 EM-Tec 122.AM SEM stub gripper tweezers for Ø12.2mm JEOL cylinder stubs
#50-050150 EM-Tec 150.AM SEM stub gripper tweezers for Ø15.0mm Hitachi and ISI cylinder stubs
#50-050250 EM-Tec 250.AM SEM stub gripper tweezers for Ø25.0mm JEOL and Hitachi cylinder stubs
#50-050320 EM-Tec 320.AM SEM stub gripper tweezers for Ø32.0mm JEOL and Hitachi cylinder stubs


General remarks:

  • AISI 304 is an austenitic stainless steel (DIN 1.4301, X5CrNi 18-10) and is the most common type of stainless steel
  • Contains 18 – 20 wt% Chromium and contains significant amounts of Nickel as additional alloy component
  • Normally non-magnetic, but becomes slightly magnetic when cold worked
  • Can not be hardened by heat treatment
  • Can be work hardened, annealing is recommended for stress relieving
  • Good corrosion resistance to most solvents, salts and moderate acids
  • Generally used where corrosion resistance is a requirement
  • Typical applications include tweezers for microscopy, electronic industry, fine mechanics and laboratory


General composition of AISI 304

Element Wt. %

C

≤0.08

Cr

18.0 – 20.0

Ni

8.0 – 10.5

Mn

≤2.0

Si

≤1.0

P

≤0.045

S

≤0.03

Fe

Balance


Properties of AISI 304

Mechanical Properties

State

Annealed

Density

8.0 g/cm3

Hardness Brinell

123

Hardness Rockwell B

70

Hardness Vickers

129

Tensile strength, ultimate

505 MPa

Tensile strength, yield

215 MPa

Yield stress, o.2%

≤200 Mpa

Elongation until break

70%

Modulus of Elasticity

195 GPa

Poisson's ratio

0.29

Thermal Properties

Coefficient of thermal linear expansion

17.3 x 10-6 /°C   (20-100°C)

Coefficient of linear thermal expansion

17.8 x 10-6/°C    (20-300°C)

Specific heat capacity

0.50 J/(g.K)

Thermal conductivity

16.2W/(m.K)

Continuous use (service) temperature

325°C

Maximum service temperature (short)

870°C

Electrical Properties

Resistivity

0.72 x 10-4 Ohm.cm



TSB 50-001010 Material for EM-Tec SEM stub gripper tweezers Revision 1




REM Zubehör

TEM Zubehör

Kalibrierung

Probenvorbereitung

AFM / SPM

  Produktübersicht mit Bilder
  REM Probenteller
  Kohlenstoffklebepads
  Adapter für Probenteller
  Adapter für Probentische
  REM Probenhalter
  REM Präparationshalter
  EM Kathoden
  Silizium-Such-Substrate
  Gatan 3View Probenteller
  FEI Volumescope Probenteller
  Boxen für Probenteller
  Phenom Zubehör
  JEOL NeoScope Zub.
  Hitachi TM Zubehör
  Probenhalterkits
  FlowView Flüssigproben-Halter

Instrumente

  Schallschutzboxen
  Cressington REM Beschichtung
  TEM Sample Prep
  Membranvakuumpumpe
  Rotationsvakuumpumpe
  Präzisions-Diamantsäge
  TEM Netzchen
  Trägerfilme
  Siliziumnitrid Trägerfilme
  K-kit Nasszelle
  Graphen Filme
  TEM Grid Boxen
  Kryo Grid Boxes
  TEM Probenkontrastierung
  TEM 3mm Einbettungsrörchen
  Kathoden
  Kunstwimper-Manipulartorset

Kryo Zubehör

  Kryo Grid Box
  Weiteres Kryo Zubehör

FIB Zubehör

  FIB Lift-out Grids
  FIB flache Probenteller
  FIB Grid Probenhalter
  FIB vorgekippte Probenhalter
  FIB vorgekippte Probenteller
  FIB Grid Aufbewahrung
  REM / FIB Vergrößerung
  REM Auflösungstandards
  EDS / WDS Standars
  TEM Kalibrierung
  AFM / SPM Kalibrierung
  LM Kalibrierung

Vakuum Zubehör

  Vakuummessung
  KF/NW Vakuumbauteile
  KF/NW Vakuumschläuche
  ISO Vakuumflansch Teile
  Vakuumöle und Fette
  Vakuum-Versiegelung
  Membranvakuumpumpe
  Rotationsvakuumpumpe
  Vakuumprobenaufbewahrung
  Vakuumpinzetten

Probebeschichtung

  Sputter Targets
  Kohlenstoffstäbe & Fäden
  Quarz Kristalle
  REM Beschichtungsflüssigkeit

Bedampfung Zubehör

  Therm. Verdampfungsquellen
  Bedampfungsmaterialien
  Auflagen & Substrate
  REM Präparationshalter
  Pinzetten
  Nadeln & Sonden
  Holzspatel & Tupfer
  Polymer Transferpipetten
  Schneidwerkzeuge / Scheren
  Leitfähige Kleber
  Leitfähige Kleberbänder/Tabs
  Nicht-leitfähige Kleber
  Probenaufbewahrung
  Werkzeuge
  Sortier-Gewebe
  Probenpräparation
  Reinigung / Handschuhe
  Leitfähige Metallpulver
  Metallographie
  AFM/SPM Metallscheiben
  AFM/SPM Scheiben Aufnahme
  AFM/SPM Halter
  AFM/SPM Aufbewahrung
  Cantilever Pinzetten
  AFM/SPM Pinzetten
  Nano-Tec Mica Scheiben
  HOPG Substrate

Lichtmikroskop Zubehör

  Korrelative Deckgläschen
  Glas-Objektträger
  Deckgläschen
  Quarz Objektträger
  Quarz-Deckgläschen
  Schwarze Metallobjektträger
  Objektträger Aufbewahrung
  Kalibrierung
  Polymerpipetten
  Reinigungspapier für Linsen
  Petrischalen
  Digitalmikroskop
  PTFE Becher